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Эта публикация цитируется в 2 научных статьях (всего в 2 статьях)
Изготовление, обработка, тестирование материалов и структур
Structural features of Sm$_{1-x}$Eu$_{x}$S thin polycrystalline films
V. V. Kaminskiia, S. M. Solov'eva, G. D. Khavrova, N. V. Sharenkovaa, Shinji Hiraib a Ioffe Institute, Russian Academy of Sciences, St. Petersburg, Russia
b Muroran Institute of Technology, Muroran, Hokkaido, Japan
Аннотация:
Thin polycrystalline Sm$_{1-x}$Eu$_{x}$S films ($x$ = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of x-ray coherent scattering regions was studied. It is shown that formation of Sm$_{1-x}$Eu$_{x}$S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.
Поступила в редакцию: 21.09.2016 Принята в печать: 28.09.2016
Образец цитирования:
V. V. Kaminskii, S. M. Solov'ev, G. D. Khavrov, N. V. Sharenkova, Shinji Hirai, “Structural features of Sm$_{1-x}$Eu$_{x}$S thin polycrystalline films”, Физика и техника полупроводников, 51:6 (2017), 860; Semiconductors, 51:6 (2017), 828–830
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/phts6147 https://www.mathnet.ru/rus/phts/v51/i6/p860
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Страница аннотации: | 38 | PDF полного текста: | 6 |
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