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Эта публикация цитируется в 5 научных статьях (всего в 5 статьях)
CHEMISTRY AND MATERIAL SCIENCE
Young's modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation
M. M. Khalisovab, V. A. Lebedevc, A. S. Poluboyarinovd, A. V. Garshevd, E. K. Khrapovaa, A. A. Krasilina, A. V. Ankudinova a Ioffe Institute, Politekhnicheskaya, 26, Saint-Petersburg 194021, Russian Federation
b Pavlov Institute of Physiology, Russian Academy of Sciences,
Makarova emb., 6, Saint-Petersburg, 199034, Russian Federation
c University of Limerick, Limerick, V94 T9PX, Ireland
d Lomonosov Moscow State University GSP-1, Leninskie Gory, Moscow, 119991, Russian Federation
Аннотация:
Ni$_3$Si$_2$O$_5$(OH)$_4$ phyllosilicate nanoscrolls were investigated by two techniques: the bending-based test method of AFM and the indentation method with visual control in STEM. In the first case, the average measured Young's modulus, about 200 GPa, turned out to be significantly higher than in the second one, 40 GPa. The reasons for this discrepancy are analyzed.
Ключевые слова:
AFM, in-situ TEM, nanomechanics, indentation, Young's modulus.
Поступила в редакцию: 10.12.2020 Исправленный вариант: 01.02.2021
Образец цитирования:
M. M. Khalisov, V. A. Lebedev, A. S. Poluboyarinov, A. V. Garshev, E. K. Khrapova, A. A. Krasilin, A. V. Ankudinov, “Young's modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation”, Наносистемы: физика, химия, математика, 12:1 (2021), 118–127
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/nano592 https://www.mathnet.ru/rus/nano/v12/i1/p118
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Страница аннотации: | 118 | PDF полного текста: | 61 |
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