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Эта публикация цитируется в 1 научной статье (всего в 1 статье)
Structural, optical and morphological study of tungsten selenide thin films
S. Arulmozhi Packiaseelia, V. Rajendranb, R. Vijayalakshmic a P.G. and Research Department of Physics, Fatima College, Madurai, India
b Department of Physics, Vivekananda College, Madurai, India
c P.G. and Research Department of Physics, Thiagarajar College, Madurai, India
Аннотация:
Tungsten selenide (WSe$_2$) film was successfully deposited on FTO substrate by brush plating technique. The film was uniform and well adherent to the substrate and annealed to 300$^\circ$ C and 500$^\circ$ C. As the annealing temperature was increased the orientation of the crystallites was more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicates that this film was crystallized in the hexagonal structure.
Ключевые слова:
WSe thin film, morphology.
Поступила в редакцию: 05.02.2016
Образец цитирования:
S. Arulmozhi Packiaseeli, V. Rajendran, R. Vijayalakshmi, “Structural, optical and morphological study of tungsten selenide thin films”, Наносистемы: физика, химия, математика, 7:4 (2016), 703–706
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/nano270 https://www.mathnet.ru/rus/nano/v7/i4/p703
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Страница аннотации: | 66 | PDF полного текста: | 53 |
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