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Characterization studies on the novel mixed thin films
P. Ramasundaria, S. Ganeshanb, R. Vijayalakshmic a P. G. and Research Department of Physics, S.V. N. College, Madurai, India
b Department of Physics, Vivekananda College, Madurai, India
c P. G. and Research Department of Physics, Thiagarajar College, Madurai, India
Аннотация:
Among electrochemical processes having a considerable impact on technical development, the mixed thin film (Mo-Ni oxide) plays an important role, due to its better mechanical, anticorrosive and thermal stability characteristics. The mixed films have been prepared by dip spin coating. The films are grown on substrates like Indium Tin Oxide (ITO) and are well adherent on the substrates, pinhole free and transparent. The X-ray diffraction analysis of the films confirms they are polycrystalline in nature. The morphological study reveals that the uniform distributions have flower-like structure. From the compositional analysis, the EDAX spectra show the presence of molybdenum and nickel. The optical band gap was found to be 1.36 eV and band assignments for Fourier Transform Infrared (FTIR) spectra are comparable to reported values.
Ключевые слова:
Dip Spin Coating, EDAX, SEM, X-Ray Diffraction.
Поступила в редакцию: 05.02.2016 Исправленный вариант: 27.04.2016
Образец цитирования:
P. Ramasundari, S. Ganeshan, R. Vijayalakshmi, “Characterization studies on the novel mixed thin films”, Наносистемы: физика, химия, математика, 7:4 (2016), 683–686
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/nano265 https://www.mathnet.ru/rus/nano/v7/i4/p683
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