|
Письма в Журнал экспериментальной и теоретической физики, 2002, том 76, выпуск 9, страницы 665–668
(Mi jetpl2972)
|
|
|
|
КОНДЕНСИРОВАННОЕ СОСТОЯНИЕ
Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide
S. V. Vyshenskiia, U. Zeitlerb, R. J. Haugb a Nuclear Physics Institute, Moscow State University
b Institut für Festkörperphysik, Universität Hannover
Аннотация:
Considering a double-barrier structure formed by a silicon quantum dot covered by natural oxide with two metallic terminals, we derive simple conditions for a step-like voltage-current curve. Due to standard chemical properties, doping phosphorus atoms located in a certain domain of the dot form geometrically parallel current channels. The height of the current step typically equals to (1.2 pA)$N$, where $N=0,1,2,3\ldots$ is the number of doping atoms inside the domain, and only negligibly depends on the actual position of the dopants. The found conditions are feasible in experimentally available structures.
Поступила в редакцию: 03.10.2002
Образец цитирования:
S. V. Vyshenskii, U. Zeitler, R. J. Haug, “Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide”, Письма в ЖЭТФ, 76:9 (2002), 665–668; JETP Letters, 76:9 (2002), 568–571
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/jetpl2972 https://www.mathnet.ru/rus/jetpl/v76/i9/p665
|
|