|
Письма в Журнал экспериментальной и теоретической физики, 2012, том 95, выпуск 10, страницы 595–600
(Mi jetpl2560)
|
|
|
|
Эта публикация цитируется в 8 научных статьях (всего в 8 статьях)
КОНДЕНСИРОВАННОЕ СОСТОЯНИЕ
Self-trapping of the $d$-$d$ charge transfer exciton in bulk NiO
evidenced by $X$-ray excited luminescence
V. I. Sokolova, V. N. Churmanovb, V. Yu. Ivanovb, N. B. Gruzdeva, P. S. Sokolovc, A. N. Baranovc, A. S. Moskvinb a Institute of Metal Physics, Ural Division of the Russian Academy of Sciences
b Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
c M. V. Lomonosov Moscow State University
Аннотация:
Soft $X$-ray (XUV) excitation did make it possible to avoid the
predominant role of the surface effects in luminescence of NiO and revealed a
bulk luminescence with a puzzling well isolated doublet of very narrow lines
with close energies near $3.3$ eV which is assigned to recombination
transitions in self-trapped $d$-$d$ charge transfer (CT) excitons formed by
coupled Jahn–Teller Ni$^+$ and Ni$^{3+}$ centers. The conclusion is
supported both by a comparative analysis of the CT luminescence spectra for
NiO and solid solutions Ni$_{x}$Zn$_{1-x}$O, and by a comprehensive cluster
model assignement of different $p$-$d$ and $d$-$d$ CT transitions, their
relaxation channels. To the best of our knowledge it is the first observation
of the luminescence due to self-trapped $d$-$d$ CT excitons.
Поступила в редакцию: 04.04.2012
Образец цитирования:
V. I. Sokolov, V. N. Churmanov, V. Yu. Ivanov, N. B. Gruzdev, P. S. Sokolov, A. N. Baranov, A. S. Moskvin, “Self-trapping of the $d$-$d$ charge transfer exciton in bulk NiO
evidenced by $X$-ray excited luminescence”, Письма в ЖЭТФ, 95:10 (2012), 595–600; JETP Letters, 95:10 (2012), 528–533
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/jetpl2560 https://www.mathnet.ru/rus/jetpl/v95/i10/p595
|
|