Аннотация:
Calculations of the magneto-optical Voigt parameter QQ were carried out using various models of reflecting media for thin films Fe|SiO22|Si(100) samples using the data of the in situ magneto-ellipsometry. The obtained spectral dependences of QQ make it possible to choose the algorithm for the analysis of experimental magneto-ellipsometry data and demonstrate that magneto-optical parameter QQ of iron is thickness-dependent.
Образец цитирования:
O. Maksimova, S. Lyaschenko, I. Tarasov, I. Yakovlev, Yu. Mikhlin, S. Varnakov, S. Ovchinnikov, “The magneto-optical voigt parameter from magneto-optical ellipsometry data for multilayer samples with single ferromagnetic layer”, Физика твердого тела, 63:9 (2021), 1311; Phys. Solid State, 63:10 (2021), 1485–1495
\RBibitem{MakLyaTar21}
\by O.~Maksimova, S.~Lyaschenko, I.~Tarasov, I.~Yakovlev, Yu.~Mikhlin, S.~Varnakov, S.~Ovchinnikov
\paper The magneto-optical voigt parameter from magneto-optical ellipsometry data for multilayer samples with single ferromagnetic layer
\jour Физика твердого тела
\yr 2021
\vol 63
\issue 9
\pages 1311
\mathnet{http://mi.mathnet.ru/ftt10132}
\elib{https://elibrary.ru/item.asp?id=47372220}
\transl
\jour Phys. Solid State
\yr 2021
\vol 63
\issue 10
\pages 1485--1495
\crossref{https://doi.org/10.1134/S1063783421090274}
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/ftt10132
https://www.mathnet.ru/rus/ftt/v63/i9/p1311
Эта публикация цитируется в следующих 3 статьяx:
Ivan Soldatov, Burak Özer, Saicharan Aswartham, Sebastian Selter, Louis Veyrat, Bernd Büchner, Rudolf Schäfer, “Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes”, IEEE Access, 12 (2024), 181025
A.L. Chekhov, Y. Behovits, U. Martens, B.R. Serrano, M. Wolf, T.S. Seifert, M. Münzenberg, T. Kampfrath, “Broadband Spintronic Detection of the Absolute Field Strength of Terahertz Electromagnetic Pulses”, Phys. Rev. Applied, 20:3 (2023)
O. A. Maximova, S. A. Lyaschenko, S. N. Varnakov, S. G. Ovchinnikov, I. A. Yakovlev, D. V. Shevtsov, T. A. Andryushchenko, “Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy”, Phys. Metals Metallogr., 124:14 (2023), 1654