1 citations to 10.1090/trans2/186 (Crossref Cited-By Service)
  1. Nikola Mitrović, Danijel Danković, Zoran Prijić, Ninoslav Stojadinović, “Modeling of NBTI degradation in p-channel VDMOSFETs”, J Appl Eng Science, 18, no. 4, 2020, 515  crossref