41 citations to 10.1002/pip.1087 (Crossref Cited-By Service)
  1. Yixian Lee, Andrew A.O. Tay, “Stress Analysis of Silicon Wafer-Based Photovoltaic Modules Under IEC 61215 Mechanical Load Test”, Energy Procedia, 33, 2013, 265  crossref
  2. Michael G. Deceglie, Timothy J Silverman, Ethan Young, William B. Hobbs, Cara Libby, “Field and Accelerated Aging of Cracked Solar Cells”, IEEE J. Photovoltaics, 13, no. 6, 2023, 836  crossref
  3. Yuki Shitanoki, Stephen J. Bennison, Yasuhiro Koike, “A Rational Strength Prediction Approach to the Design of Double-Glass Photovoltaic Modules”, IEEE J. Photovoltaics, 4, no. 4, 2014, 1071  crossref
  4. Georgios Goudelis, Pavlos I. Lazaridis, Mahmoud Dhimish, “A Review of Models for Photovoltaic Crack and Hotspot Prediction”, Energies, 15, no. 12, 2022, 4303  crossref
  5. Mingyao Ma, Zhixiang Zhang, Zhen Xie, Ping Yun, Xing Zhang, Fei Li, “Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve”, Microelectronics Reliability, 114, 2020, 113848  crossref
  6. Hubert Seigneur, Jason Lincoln, Eric Schneller, Andrew M. Gabor, 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), 2018, 1328  crossref
  7. Lele Peng, Bo Liu, Shubin Zheng, Xieqi Chen, Qianwen Zhong, Xiaodong Chai, “A new dynamic 2D fusion model and output characteristic analysis of floating photovoltaic modules considering motion and environmental factors”, Energy Conversion and Management, 294, 2023, 117588  crossref
  8. Peter Hacke, Michael Owen-Bellini, Michael D. Kempe, Dana B. Sulas-Kern, David C. Miller, Marko Jankovec, Stefan Mitterhofer, Marko Topič, Sergiu Spataru, William Gambogi, Tadanori Tanahashi, “Acceleration Factors for Combined‐Accelerated Stress Testing of Photovoltaic Modules”, Solar RRL, 7, no. 12, 2023, 2300068  crossref
  9. Ansgar Steland, Frontiers in Statistical Quality Control 11, 2015, 287  crossref
  10. Jorg Kasewieter, Felix Haase, Marc Kontges, “Model of Cracked Solar Cell Metallization Leading to Permanent Module Power Loss”, IEEE J. Photovoltaics, 6, no. 1, 2016, 28  crossref
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