She is Head of the Development and Application Lab at deepXscan GmbH in Dresden, a start-up company that she joined in 2022. Her responsibilities include to develop customized solutions for high-resolution 3D imaging and to coordinate development projects. Kristina Kutukova received her double Master degree in Non-Destructive Testing at Dresden International University, Germany, and Tomsk Polytechnic University, Russia, in 2016 and her PhD from the Brandenburg University of Technology Cottbus-Senftenberg, Germany, in 2023. She was a research associate in the Department of Microelectronic Materials and Nano-scale Analysis at Fraunhofer Institute for Ceramic Technologies and Systems Dresden, Germany. Kristina Kutukova has published more than 10 publications in peer-reviewed journals with more than 60 citations (h-index 6).
K. B. Bulatov, A. S. Ingacheva, M. I. Gilmanov, K. Kutukova, Zh. V. Soldatova, A. V. Buzmakov, M. V. Chukalina, E. Zschech, V. V. Arlazarov, “Towards monitored tomographic reconstruction: algorithm-dependence and convergence”, Компьютерная оптика, 47:4 (2023), 658–667