Simulation and test generation of digital circuits, genetic algorithms, simulating annealing algorithms, parallel algorithms.

1. Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov, “Evolutionary distributed test generation methods for digital circuits”, Proc. of 8th International Workshop on Boolean Problems (September 18–19, 2008, Freiberg, Germany), 213–218
2. D.E. Ivanov, “Ivanov Parallel fault simulation on multi-core processors”, Radioelektronni i komp’yuterni sistemi, 6:40 (2009), 109–112
3. Skobtsov Y.A., El-Khatib, Ivanov D.E., “Distributed Genetic Algorithm of Test Generation For Digital Circuits”, Proceedings of the 10th Biennial Baltic Electronics Conference, Tallinn Technical University, 2006, 281–284
4. Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov, R. Ubar, J. Raik, “Evolutionary Approach to Test Generation for Functional BIST”, 10 European Test Symposium. Informal Digest of Papers. Digest of Papers, 151–155
5. D.E. Ivanov, “Algoritm parallelnogo vychisleniya otsenok osobei pri verifikatsii ekvivalentnosti posledovatelnostnykh skhem”, Problemy informatsionnykh tekhnologii, 1:005 (2009), 105–112

• Institute of Applied Mathematics and Mechanics, Donetsk