S. È. Tyaginov, A. A. Makarov, M. Jech, M. I. Vexler, J. Franco, B. Kaczer, T. Grasser, “Physical principles of self-consistent simulation of the generation of interface states and the transport of hot charge carriers in field-effect transistors based on metal–oxide–semiconductor structures”, Fizika i Tekhnika Poluprovodnikov, 52:2 (2018), 254–259; Semiconductors, 52:2 (2018), 242–247
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