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Publications in Math-Net.Ru |
Citations |
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2018 |
1. |
D. A. Kirienko, O. Ya. Berezina, “A neural-network method of predicting defect formation on the surface of thin ITO films under mechanical load”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:9 (2018), 81–87 ; Tech. Phys. Lett., 44:5 (2018), 401–403 |
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2017 |
2. |
D. A. Kirienko, O. Ya. Berezina, “On the detachment of thin ITO films from silicon substrate by microsecond laser irradiation”, Fizika i Tekhnika Poluprovodnikov, 51:6 (2017), 855–859 ; Semiconductors, 51:6 (2017), 823–827 |
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