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Publications in Math-Net.Ru |
Citations |
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2020 |
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A. A. Shiryaev, V. M. Vorotyntsev, E. L. Shobolov, “Prediction of the magnitude of the trapped charge in the buried oxide of silicon-on-insulator structures using the Poole–Frenkel effect”, Fizika i Tekhnika Poluprovodnikov, 54:5 (2020), 441–445   ; Semiconductors, 54:5 (2020), 518–522 |
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2018 |
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A. A. Shiryaev, V. M. Vorotyntsev, E. L. Shobolov, “Poole–Frenkel effect and the opportunity of its application for the prediction of radiation charge accumulation in thermal silicon dioxide”, Fizika i Tekhnika Poluprovodnikov, 52:9 (2018), 990–994 ; Semiconductors, 52:9 (2018), 1114–1117 |
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