A. S. Shulakov, E. O. Filatova, A. P. Stepanov, S. K. Kozhakhmetov, “X-ray spectroscopic study of the distribution of structural defects in implanted silicon”, Fizika Tverdogo Tela, 32:10 (1990), 2895–2898
2.
E. O. Filatova, T. A. Blagoveshchenskaya, S. K. Kozhakhmetov, “Reflection spectra of $\mathrm{BN}_{hex}$ near the $K$-threshold of boron ionization”, Fizika Tverdogo Tela, 32:5 (1990), 1551–1554
Contact us: