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Publications in Math-Net.Ru |
Citations |
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1992 |
1. |
M. D. Volnyanskii, A. Yu. Kudzin, I. L. Chertkov, “Using the internal friction method to study defects in $\mathrm{Cr}$-doped and $\mathrm{Al}$-doped $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$”, Fizika Tverdogo Tela, 34:1 (1992), 225–231 |
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1987 |
2. |
M. D. Volnyanskii, A. Yu. Kudzin, I. L. Chertkov, “Internal friction in $\mathrm{Bi}_{12}\mathrm{GeO}_{20}$ and $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$ associated with electronic state”, Fizika Tverdogo Tela, 29:1 (1987), 228–230 |
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1984 |
3. |
M. D. Volnyanskii, A. Yu. Kudzin, I. L. Chertkov, “Internal friction peak due to conductivity state in $\mathrm{Bi}_{12}\mathrm{GeO}_{20}$”, Fizika Tverdogo Tela, 26:3 (1984), 928–929 |
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Organisations |
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