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Publications in Math-Net.Ru |
Citations |
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1990 |
1. |
M. Yu. Kupriyanov, K. K. Likharev, “Josephson effect in high-temperature superconductors and in structures based on them”, UFN, 160:5 (1990), 49–87 ; Phys. Usp., 33:5 (1990), 340–364 |
88
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1989 |
2. |
A. N. Vistavkin, V. K. Kaplunenko, V. P. Koshelets, K. K. Likharev, V. V. Migulin, O. A. Mukhanov, G. A. Ovsyannikov, V. K. Semenov, I. L. Serpuchenko, “EXPERIMENTAL-STUDY OF RESISTIVE ONE-QUANTUM LOGIC STRUCTURE”, Zhurnal Tekhnicheskoi Fiziki, 59:12 (1989), 26–34 |
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1988 |
3. |
A. I. Golovashkin, A. L. Gudkov, S. I. Krasnosvobodtsev, L. S. Kuzmin, K. K. Likharev, Yu. V. Maslennikov, Y. A. Pashkin, E. V. Pechen, O. V. Snigirev, “JOSEPHSON-JUNCTIONS IN THIN-FILMS OF HIGH-TEMPERATURE SUPERCONDUCTORS AT
T=77-K”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:14 (1988), 1256–1260 |
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1987 |
4. |
A. N. Vistavkin, V. P. Koshelets, K. K. Likharev, V. V. Migulin, O. A. Mukhanov, G. A. Ovsyannikov, V. K. Semenov, I. L. Serpuchenko, “Experimental realization of the resistive single quantum integral logic-circuit”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:5 (1987), 286–290 |
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1985 |
5. |
A. L. Gudkov, K. K. Likharev, V. I. Makhov, “High-quality surface Josephson effects in $Nb-Si^{*}-Nb$”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:23 (1985), 1423–1428 |
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1983 |
6. |
K. K. Likharev, “True quantum-mechanical macroscopic effects in weak superconductivity”, UFN, 139:1 (1983), 169–184 ; Phys. Usp., 26:1 (1983), 87–95 |
28
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1979 |
7. |
K. K. Likharev, “Сверхпроводящие слабые связи: стационарные процессы”, UFN, 127:2 (1979), 185–220 |
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1991 |
8. |
K. K. Likharev, “Two books on superconductor electronics”, UFN, 161:2 (1991), 210–212 ; Phys. Usp., 34:2 (1991), 212–213 |
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1986 |
9. |
L. G. Aslamazov, V. L. Ginzburg, D. A. Kirzhnits, G. A. Leksin, K. K. Likharev, Yu. A. Osip'yan, V. I. Tatarskii, A. I. Shal'nikov, Yu. V. Sharvin, “Памяти Вадима Васильевича Шмидта”, UFN, 149:1 (1986), 163–164 ; Phys. Usp., 29:5 (1986), 476–477 |
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1982 |
10. |
L. S. Kuz'min, K. K. Likharev, “Хорошее введение в теорию параметрических систем”, UFN, 138:4 (1982), 687 |
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