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Publications in Math-Net.Ru |
Citations |
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1986 |
| 1. |
V. M. Kaganer, N. O. Krylova, V. L. Indenbom, I. L. Shul'pina, “Wave packets and microdefect images in double crystal X-ray topography”, Fizika Tverdogo Tela, 28:8 (1986), 2343–2351  |
| 2. |
N. O. Krylova, V. Meling, I. L. Shul'pina, È. G. Sheikhet, “X-ray topography study of microdefects in silicon”, Fizika Tverdogo Tela, 28:2 (1986), 440–446 |
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1983 |
| 3. |
N. O. Krylova, E. K. Kovev, I. L. Shul'pina, “METHODS OF THE STUDY OF MICRODEFECTS IN SILICON MONOCRYSTALS ON AN X-RAY
TOPOGRAPHIC DTS-1 SPECTROMETER”, Zhurnal Tekhnicheskoi Fiziki, 53:9 (1983), 1750–1753 |
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