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Publications in Math-Net.Ru |
Citations |
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2010 |
| 1. |
S. G. Gevorgyan, S. T. Muradyan, M. H. Azaryan, G. H. Karapetyan, “Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method”, Proceedings of the YSU, Physical and Mathematical Sciences, 2010, no. 3, 63–67  |
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1984 |
| 2. |
Z. N. Adamyan, M. H. Azaryan, V. M. Arutyunyan, I. I. Saidashev, Yu. V. Shmartsev, “Noise in Symmetric Planar Structures of Silicon Compensated with Zinc”, Fizika i Tekhnika Poluprovodnikov, 18:7 (1984), 1173–1177 |
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