E. V. Demidov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov, “Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching”, Semiconductors, 51:7 (2017), 840–842
E V Demidov, V M Grabov, V A Komarov, A V Suslov, M V Suslov, “The method of measuring the thermoelectric power in the thin films of the semimetals and narrow-gap semiconductors formed on the thin substrates”, J. Phys.: Conf. Ser., 857 (2017), 012006
N. S. Kablukova, V. A. Komarov, D. O. Skanchenko, E. S. Makarova, E. V. Demidov, “Galvanomagnetic properties of bismuth films with a thin antimony coating or sublayer”, Semiconductors, 51:7 (2017), 879–882