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This article is cited in 6 scientific papers (total in 6 papers)
Mathematical physics
Comparative analysis of algorithms for solving inverse problems related to monochromatic monitoring the deposition of multilayer optical coatings
I. V. Kochikova, Yu. S. Lagutinbc, A. A. Lagutinabc, D. V. Lukyanenkobc, A. V. Tikhonravovab, S. A. Sharapovaab, A. G. Yagolac a Research Computing Center, Lomonosov Moscow State University, 119234, Moscow, Russia
b Moscow Center for Fundamental and Applied Mathematics, 119234, Moscow, Russia
c Department of Physics, Lomonosov Moscow State University, 119991, Moscow, Russia
Abstract:
The paper presents a comparative analysis of three fundamentally different algorithms for solving inverse problems of monitoring the layer thicknesses of optical coatings based on the data of monochromatic measurements of the reflection/transmission coefficients during deposition process. The previously developed geometric approach to the study of the thickness error correlation of deposited coatings is extended to the case of monochromatic measurements. A new parameter called the self-compensation factor was introduced to estimate the effect of error self-compensation. Its role in assessing the prospects for using various algorithms for coating deposition monitoring is shown.
Key words:
inverse problems, algorithms, optical coatings, monochromatic monitoring, error correlation, error self-compensation.
Received: 05.11.2020 Revised: 05.11.2020 Accepted: 11.02.2021
Citation:
I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, S. A. Sharapova, A. G. Yagola, “Comparative analysis of algorithms for solving inverse problems related to monochromatic monitoring the deposition of multilayer optical coatings”, Zh. Vychisl. Mat. Mat. Fiz., 61:9 (2021), 1528–1535; Comput. Math. Math. Phys., 61:9 (2021), 1504–1510
Linking options:
https://www.mathnet.ru/eng/zvmmf11292 https://www.mathnet.ru/eng/zvmmf/v61/i9/p1528
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