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This article is cited in 4 scientific papers (total in 4 papers)
Error estimation for computed polycrystalline texture characteristics by varying measurement parameters in electron microscopy methods
A. O. Antonova, T. I. Savyolova Moscow Engineering Physics Institute (State University), Kashirskoe sh. 31, Moscow, 115409, Russia
Abstract:
A two-dimensional mathematical model is proposed for a polycrystalline specimen and an electron microscopy experiment with varying measurement parameters, such as the scanning step and the threshold disorientation angle. Experimental results are used to compare specimen texture characteristics and measurements: the grain size distribution, average grain size, variance; disorientation angle distribution, average disorientation angle, variance; and estimates of the orientation distribution function in three-dimensional form in a one-parameter representation. All these distributions are tested by applying a chi-square homogeneity test. The most important aspects of the experiment are formulated as propositions.
Key words:
orientation on the rotation group $SO(3)$, Monte Carlo method, grain size distribution density, disorientation angle distribution density, orientation distribution function, measurement step, threshold disorientation angle, chi-square test.
Received: 24.06.2014
Citation:
A. O. Antonova, T. I. Savyolova, “Error estimation for computed polycrystalline texture characteristics by varying measurement parameters in electron microscopy methods”, Zh. Vychisl. Mat. Mat. Fiz., 55:2 (2015), 322–334; Comput. Math. Math. Phys., 55:2 (2015), 317–329
Linking options:
https://www.mathnet.ru/eng/zvmmf10161 https://www.mathnet.ru/eng/zvmmf/v55/i2/p322
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Abstract page: | 273 | Full-text PDF : | 76 | References: | 61 | First page: | 13 |
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