Zapiski Nauchnykh Seminarov POMI
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Impact factor

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Zap. Nauchn. Sem. POMI:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Zapiski Nauchnykh Seminarov POMI, 2015, Volume 437, Pages 81–99 (Mi znsl6174)  

This article is cited in 5 scientific papers (total in 5 papers)

A study of the growth of maximal and typical normalized dimensions of strict Young diagrams

N. N. Vasiliev, V. S. Duzhin

St. Petersburg Department of Steklov Mathematical Institute of Russian Academy of Sciences, St. Petersburg, Russia
Full-text PDF (524 kB) Citations (5)
References:
Abstract: In this paper, we investigate the asymptotics of the normalized dimensions of strict Young diagrams (i.e., the numbers of paths to vertices in the Schur graph). We describe the results of corresponding computer experiments. The strict Young diagrams parametrize the projective representations of the symmetric group $S_n$. So, the asymptotics of the normalized dimensions of diagrams gives us the asymptotics of the dimensions of projective representations as well. Sequences of strict diagrams of high dimension consisting of up to one million cells were built. It was proved by an exhaustive search that the first 250 diagrams of all these sequences have the maximum possible dimensions. Presumably, these sequences contain infinitely many diagrams of maximum dimension, and thus give the correct asymptotics of their growth. Also, we investigate the behavior of the normalized dimensions of typical diagrams with respect to the Plancherel measure on the Schur graph. The calculations strongly agree with A. M. Vershik's hypothesis on the convergence of the normalized dimensions of maximal and Plancherel typical diagrams not only for the standard Young graph, but also for the Schur graph.
Key words and phrases: Young diagrams, Plancherel process, Schur graph, projective representations, symmetric group.
Funding agency Grant number
Russian Science Foundation 14-11-00581
Received: 07.10.2015
English version:
Journal of Mathematical Sciences (New York), 2016, Volume 216, Issue 1, Pages 53–64
DOI: https://doi.org/10.1007/s10958-016-2887-x
Bibliographic databases:
Document Type: Article
UDC: 517.987
Language: Russian
Citation: N. N. Vasiliev, V. S. Duzhin, “A study of the growth of maximal and typical normalized dimensions of strict Young diagrams”, Representation theory, dynamical systems, combinatorial and algoritmic methods. Part XXVI. Representation theory, dynamical systems, combinatorial methods, Zap. Nauchn. Sem. POMI, 437, POMI, St. Petersburg, 2015, 81–99; J. Math. Sci. (N. Y.), 216:1 (2016), 53–64
Citation in format AMSBIB
\Bibitem{VasDuz15}
\by N.~N.~Vasiliev, V.~S.~Duzhin
\paper A study of the growth of maximal and typical normalized dimensions of strict Young diagrams
\inbook Representation theory, dynamical systems, combinatorial and algoritmic methods. Part~XXVI. Representation theory, dynamical systems, combinatorial methods
\serial Zap. Nauchn. Sem. POMI
\yr 2015
\vol 437
\pages 81--99
\publ POMI
\publaddr St.~Petersburg
\mathnet{http://mi.mathnet.ru/znsl6174}
\mathscinet{http://mathscinet.ams.org/mathscinet-getitem?mr=3499909}
\transl
\jour J. Math. Sci. (N. Y.)
\yr 2016
\vol 216
\issue 1
\pages 53--64
\crossref{https://doi.org/10.1007/s10958-016-2887-x}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84969784610}
Linking options:
  • https://www.mathnet.ru/eng/znsl6174
  • https://www.mathnet.ru/eng/znsl/v437/p81
  • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Записки научных семинаров ПОМИ
    Statistics & downloads:
    Abstract page:203
    Full-text PDF :52
    References:53
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024