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This article is cited in 1 scientific paper (total in 1 paper)
Programming & Computer Software
Method for expanding the object base of examination by stitching solutions of hierarchy analysis method
S. V. Bukharina, A. V. Melnikovb, V. V. Menshihb a Voronezh State University of Engineering Technologies, Voronezh, Russian Federation
b Voronezh Institute of the Ministry of Internal Affairs of Russia, Voronezh, Russian Federation
Abstract:
The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21–24, that is enough for the most practical cases of examination.
Keywords:
hierarchy analysis method; optoelectronic detectors; quality index.
Received: 25.01.2017
Citation:
S. V. Bukharin, A. V. Melnikov, V. V. Menshih, “Method for expanding the object base of examination by stitching solutions of hierarchy analysis method”, Vestnik YuUrGU. Ser. Mat. Model. Progr., 10:2 (2017), 74–82
Linking options:
https://www.mathnet.ru/eng/vyuru373 https://www.mathnet.ru/eng/vyuru/v10/i2/p74
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Abstract page: | 156 | Full-text PDF : | 39 | References: | 35 |
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