Vestnik Sankt-Peterburgskogo Universiteta. Seriya 10. Prikladnaya Matematika. Informatika. Protsessy Upravleniya
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Vestnik Sankt-Peterburgskogo Universiteta. Seriya 10. Prikladnaya Matematika. Informatika. Protsessy Upravleniya, 2011, Issue 1, Pages 60–75 (Mi vspui20)  

Applied mathematics

Mathematical modeling of ion microprobes with fringe fields effects

Yu. V. Tereshonkova, S. N. Andrianova, M. Jakšićb, Ž. Pastuovićb, T. Tadićb

a St. Petersburg State University, Faculty of Applied Mathematics and Control Processes
b Rudjer Boškovic Institute, Zagreb, Croatia
References:
Abstract: Fringe field influence on beam characteristics was investigated and estimated in microprobes. It is possible to obtain better beam characteristics with fringe field effects in comparison with the rectangular model. Some recommendation were given in order to improve microprobe parameters and show that linear model is not appropriate for constructing real microprobes because beam characteristics significantly suffer from nonlinear aberrations.
Keywords: mathematical and computer modeling, microprobes, symbolic calculations, fringe fields, aberrations.

Accepted: October 14, 2010
Document Type: Article
UDC: 004.942+519.876.2+537.636
Language: Russian
Citation: Yu. V. Tereshonkov, S. N. Andrianov, M. Jakšić, Ž. Pastuović, T. Tadić, “Mathematical modeling of ion microprobes with fringe fields effects”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 2011, no. 1, 60–75
Citation in format AMSBIB
\Bibitem{TerAndJak11}
\by Yu.~V.~Tereshonkov, S.~N.~Andrianov, M.~Jak{\v s}i{\'c}, {\v Z}.~Pastuovi{\'c}, T.~Tadi{\'c}
\paper Mathematical modeling of ion microprobes with fringe fields effects
\jour Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr.
\yr 2011
\issue 1
\pages 60--75
\mathnet{http://mi.mathnet.ru/vspui20}
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    Вестник Санкт-Петербургского университета. Серия 10. Прикладная математика. Информатика. Процессы управления
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    References:34
    First page:4
     
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