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Vestnik Sankt-Peterburgskogo Universiteta. Seriya 10. Prikladnaya Matematika. Informatika. Protsessy Upravleniya, 2011, Issue 1, Pages 60–75
(Mi vspui20)
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Applied mathematics
Mathematical modeling of ion microprobes with fringe fields effects
Yu. V. Tereshonkova, S. N. Andrianova, M. Jakšićb, Ž. Pastuovićb, T. Tadićb a St. Petersburg State University, Faculty of Applied Mathematics and Control Processes
b Rudjer Boškovic Institute, Zagreb, Croatia
Abstract:
Fringe field influence on beam characteristics was investigated and estimated in microprobes. It is possible to obtain better beam characteristics with fringe field effects in comparison with the rectangular model. Some recommendation were given in order to improve microprobe parameters and show that linear model is not appropriate for constructing real microprobes because beam characteristics significantly suffer from nonlinear aberrations.
Keywords:
mathematical and computer modeling, microprobes, symbolic calculations, fringe fields, aberrations.
Accepted: October 14, 2010
Citation:
Yu. V. Tereshonkov, S. N. Andrianov, M. Jakšić, Ž. Pastuović, T. Tadić, “Mathematical modeling of ion microprobes with fringe fields effects”, Vestnik S.-Petersburg Univ. Ser. 10. Prikl. Mat. Inform. Prots. Upr., 2011, no. 1, 60–75
Linking options:
https://www.mathnet.ru/eng/vspui20 https://www.mathnet.ru/eng/vspui/y2011/i1/p60
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Abstract page: | 186 | Full-text PDF : | 116 | References: | 34 | First page: | 4 |
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