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Vestnik SamGU. Estestvenno-Nauchnaya Ser., 2010, Issue 6(80), Pages 116–124 (Mi vsgu200)  
Physics

Analysis and elimination of influence of the optical extent on the parametric estimator of the surface microrelief which is produced by the optical and electronic complex

A. D. Abramov, A. I. Nikonov

Dept. of Electronic Systems and Information Security, Samara State Technical University, Samara, 443100, Russian Federation
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Abstract: In this article the method of compensation of auxillary measurement error by means of optical and electronic complex of the parameters of surface microrelief which appears as a result of the deflection of the light flux level from its nominal meaning is viewed. The method is based on the determination of autocorrelative functions by the image of analyzed surface.
Keywords: method, optical and electronic complex, measurement, converter, surface, light flux, image, error, compensation, autocorrelation.
Received: 22.03.2010
Revised: 22.03.2010
Document Type: Article
UDC: 621.517+681.142.36
Language: Russian
Citation: A. D. Abramov, A. I. Nikonov, “Analysis and elimination of influence of the optical extent on the parametric estimator of the surface microrelief which is produced by the optical and electronic complex”, Vestnik Samarskogo Gosudarstvennogo Universiteta. Estestvenno-Nauchnaya Seriya, 2010, no. 6(80), 116–124
Citation in format AMSBIB
\Bibitem{AbrNik10}
\by A.~D.~Abramov, A.~I.~Nikonov
\paper Analysis and elimination of influence of the optical extent on the parametric estimator of the surface microrelief which is produced by the optical and electronic complex
\jour Vestnik Samarskogo Gosudarstvennogo Universiteta. Estestvenno-Nauchnaya Seriya
\yr 2010
\issue 6(80)
\pages 116--124
\mathnet{http://mi.mathnet.ru/vsgu200}
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    		Вестник Самарского государственного университета. Естественнонаучная серия
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