Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika
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Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika, 2012, Number 2, Pages 24–29 (Mi vmumm475)  
This article is cited in 6 scientific papers (total in 6 papers)

Mathematics

A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length

D. S. Romanov

Lomonosov Moscow State University, Faculty of Computational Mathematics and Cybernetics
Full-text PDF (295 kB) Citations (6)
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Abstract: It is constructively proved that any Boolean function of $n$ variables may be implemented in the basis of gates $\{ x\& y, x\oplus y, 1, {\bar x}(y\vee z)\vee x(y\sim z)\}$ by a testable combinational circuit admitting a fault detection test set whose power does not exceed 4 under arbitrary single inverse or constant (stuck-at) faults at outputs of gates.
Key words: combinational circuit, fault detection test set, constant (stuck-at) fault at output of gate, inverse fault at output of gate, Shannon function, easy-testable circuit.
Funding agency Grant number
Russian Foundation for Basic Research 09-01-00817-а
10-01-00768-а
12-01-00964-а
Received: 11.02.2011
Revised: 07.09.2011
English version:
Moscow University Mathematics Bulletin, 2012, Volume 67, Issue 2, Pages 69–73
DOI: https://doi.org/10.3103/S0027132212020064
Bibliographic databases:
Document Type: Article
UDC: 519.718
Language: Russian
Citation: D. S. Romanov, “A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2012, no. 2, 24–29; Moscow University Mathematics Bulletin, 67:2 (2012), 69–73
Citation in format AMSBIB
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    • This publication is cited in the following 6 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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