Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika
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Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika, 2022, Number 5, Pages 51–54 (Mi vmumm4497)  
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Short complete diagnostic tests for logic circuits in one infinite basis

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
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Abstract: We prove that each Boolean function can be modeled by a logic circuit with one additional input in a basis consisting of conjunctions of an arbitrary number of variables, two-input disjunction and negation, allowing a complete diagnostic test with the length no more than $n+1$ relative to constant faults of type $1$ at outputs of logic gates.
Key words: logic network, stuck-at fault, complete diagnostic test, Boolean function.
Funding agency Grant number
Russian Science Foundation 19-71-30004
The work is supported by the Russian Science Foundation, project no. 19-71-30004.
Received: 04.02.2022
English version:
Moscow University Mathematics Bulletin, 2022, Volume 77, Issue 5, Pages 250–253
DOI: https://doi.org/10.3103/S0027132222050072
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Short complete diagnostic tests for logic circuits in one infinite basis”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2022, no. 5, 51–54; Moscow University Mathematics Bulletin, 77:5 (2022), 250–253
Citation in format AMSBIB
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\by K.~A.~Popkov
\paper Short complete diagnostic tests for logic circuits in one infinite basis
\jour Vestnik Moskov. Univ. Ser.~1. Mat. Mekh.
\yr 2022
\issue 5
\pages 51--54
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\zmath{https://zbmath.org/?q=an:7660977}
\elib{https://elibrary.ru/item.asp?id=49553381}
\transl
\jour Moscow University Mathematics Bulletin
\yr 2022
\vol 77
\issue 5
\pages 250--253
\crossref{https://doi.org/10.3103/S0027132222050072}
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