|
Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika, 2015, Number 4, Pages 49–51
(Mi vmumm252)
|
|
|
|
This article is cited in 13 scientific papers (total in 13 papers)
Short notes
Lower estimate of the length of the complete test in the basis $\{x|y\}$
Yu. V. Borodina Keldysh Institute of Applied Mathematics, Moscow
Abstract:
It is proved that the length of the complete test is no less than $n+1$ ($n\ge 2$) for any circuit realizing the function $x_1\vee x_2\vee \ldots \vee x_n$ in the “ Sheffer stroke” basis with possible constant faults of type “1”. An example of such circuit is constructed so that the length of the complete test is exactly $n+1$.
Key words:
curcuits of functional elements, constant faults, complete tests.
Received: 27.06.2014
Citation:
Yu. V. Borodina, “Lower estimate of the length of the complete test in the basis $\{x|y\}$”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015, no. 4, 49–51; Moscow University Mathematics Bulletin, 70:4 (2015), 185–186
Linking options:
https://www.mathnet.ru/eng/vmumm252 https://www.mathnet.ru/eng/vmumm/y2015/i4/p49
|
Statistics & downloads: |
Abstract page: | 158 | Full-text PDF : | 29 | References: | 31 |
|