Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika
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Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika, 2015, Number 1, Pages 55–59 (Mi vmumm209)  
This article is cited in 2 scientific papers (total in 2 papers)

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Complete tests relative to displacing faults of inputs of circuits

E. V. Morozov

Lomonosov Moscow State University, Faculty of Computational Mathematics and Cybernetics
Full-text PDF (337 kB) Citations (2)
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Abstract: The paper is focused on faults of circuit inputs such that the output value of fault circuits depends only on correct inputs. It is shown that the Shannon function of the length of the detecting test for such faults is equal to $2n-\log_2{n}+O(\log_2{\log_2{n}})$ and the Shannon function of the length of the diagnostic test is asymptotically equal to $2^n$.
Key words: Boolean function, Shannon function, tests.
Funding agency Grant number
Russian Foundation for Basic Research 12-01-00964-а
Received: 12.12.2013
English version:
Moscow University Mathematics Bulletin, 2015, Volume 70, Issue 1, Pages 37–40
DOI: https://doi.org/10.3103/S0027132215010076
Bibliographic databases:
Document Type: Article
UDC: 519.718
Language: Russian
Citation: E. V. Morozov, “Complete tests relative to displacing faults of inputs of circuits”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015, no. 1, 55–59; Moscow University Mathematics Bulletin, 70:1 (2015), 37–40
Citation in format AMSBIB
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    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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