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Numerical methods and programming, 2003, Volume 4, Issue 1, Pages 26–32
(Mi vmp698)
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This article is cited in 3 scientific papers (total in 3 papers)
On an inverse problem of quantitative electron probe microanalysis
D. V. Zotyeva, M. N. Filippovb, A. G. Yagolaa a Lomonosov Moscow State University, Faculty of Physics
b Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Moscow
Abstract:
A method for the tracer-free experimental determination of the function
generating the in-depth characteristic X-ray used for evaluation of
component concentrations in electron probe microanalysis is considered.
Application of our method brings about to an inverse problem for a Fredholm
equation of the first kind. An algorithm for solving this problem is proposed;
the algorithm is based on the information given a priori and on physical
restrictions imposed on the sought-for function.
Keywords:
Fredholm equations of the first kind, electron probe microanalysis, tracer-free method, inverse problems, regularization method.
Citation:
D. V. Zotyev, M. N. Filippov, A. G. Yagola, “On an inverse problem of quantitative electron probe microanalysis”, Num. Meth. Prog., 4:1 (2003), 26–32
Linking options:
https://www.mathnet.ru/eng/vmp698 https://www.mathnet.ru/eng/vmp/v4/i1/p26
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Abstract page: | 134 | Full-text PDF : | 47 |
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