Stabilization of computational algorithms for the characterization of thin film coatings

Development of stable computational algorithms for the on-line characterization of thin film optical coatings is a key to the success of their application in many challenging technological areas. This paper presents a general idea that enables one to develop computationally effective and stable characterization algorithms for practically all modern production environments used for optical coating manufacturing. The efficiency of one of such algorithms is demonstrated using a new research methodology called computational manufacturing.