A posteriori analysis of reliability of radio-electronic systems

The a posteriori analysis of reliability is made after production of a pilot batch of the equipment for the purpose of definition of its characteristics of reliability. Such tests are necessary because at a device design stage the designer has no full a priori data, which would allow to define the reliability indicators with rather high reliability in advance. An important source of data collection about reliability is the system of data collection about work of products in the course of their operation. There are two main types of fail-safe tests. One of them is a standard test, task of which is the assessment of indicators of reliability. The object of such tests is production-type devices. Other type of tests is control tests, which check the compliance to specifications of an indicator of reliability of the system. The first type of tests are investigated. The order of carrying out statistical tests of radio-electronic systems on various procedures is shown. The estimations of the average time of no-failure operation, reliability of average time of no-failure operation and duration of tests are made. It is shown that while assessing the average time of no-failure operation, the method of maximum likelihood is more effective than tests $[n,\text{Б},r]$.