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Uspekhi Fizicheskikh Nauk, 1975, Volume 116, Number 2, Pages 303–314
DOI: https://doi.org/10.3367/UFNr.0116.197506d.0303 (Mi ufn9999) 		 
This article is cited in 5 scientific papers (total in 5 papers)

NEW INSTRUMENTS AND METHODS OF MEASUREMENT

Use of high-voltage electron microscopy in solid-state physics

G. G. Bondarenko, L. N. Bystrov, L. I. Ivanov, Yu. M. Platov

Baikov Institute of Metallurgy USSR Academy of Sciences, Moscow
Full-text PDF (1294 kB) Citations (5)
DOI: https://doi.org/10.3367/UFNr.0116.197506d.0303
Abstract: An analysis is made of the use of high-voltage electron microscopes in solid-state physics research. The most promising fields of application of high-voltage electron microscopes are discussed; these involve mainly research on the mechanism of the action of radiation on solids.
English version:
Physics–Uspekhi, 1975, Volume 18, Issue 6, Pages 446–451
DOI: https://doi.org/10.1070/PU1975v018n06ABEH001966
Document Type: Article
UDC: 537.533.35.07:539.2
PACS: 07.80., 61.16.D, 61.80.F
Language: Russian
Citation: G. G. Bondarenko, L. N. Bystrov, L. I. Ivanov, Yu. M. Platov, “Use of high-voltage electron microscopy in solid-state physics”, UFN, 116:2 (1975), 303–314; Phys. Usp., 18:6 (1975), 446–451
Citation in format AMSBIB
\Bibitem{BonBysIva75}
\by G.~G.~Bondarenko, L.~N.~Bystrov, L.~I.~Ivanov, Yu.~M.~Platov
\paper Use of high-voltage electron microscopy in solid-state physics
\jour UFN
\yr 1975
\vol 116
\issue 2
\pages 303--314
\mathnet{http://mi.mathnet.ru/ufn9999}
\crossref{https://doi.org/10.3367/UFNr.0116.197506d.0303}
\transl
\jour Phys. Usp.
\yr 1975
\vol 18
\issue 6
\pages 446--451
\crossref{https://doi.org/10.1070/PU1975v018n06ABEH001966}
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    • This publication is cited in the following 5 articles:
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