Uspekhi Fizicheskikh Nauk
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Forthcoming papers
Archive
Impact factor
Guidelines for authors
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



UFN:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Uspekhi Fizicheskikh Nauk, 1986, Volume 149, Number 2, Pages 275–324
DOI: https://doi.org/10.3367/UFNr.0149.198606d.0275
(Mi ufn8121)
 

This article is cited in 38 scientific papers (total in 38 papers)

NEW INSTRUMENTS AND RESEARCH METHODS

EXAFS spectroscopy: a new method for structural investigation

I. B. Borovskiia, R. V. Vedrinskiib, V. L. Kraĭzmanb, V. P. Sachenkob

a Institute of Solid State Physics of the Academy of Sciences SSSR, Chernogolovka, Moscow region
b Rostov State University
Abstract: EXAFS spectroscopy is a new method of investigating materials which allows one to determine structural parameters of the local environment of atoms with some specified $\mathbf{Z}$ by studying their x-ray spectra. Among these parameters are the interatomic spacings, coordination numbers and amplitudes of thermal oscillations. It is not necessary for long-range order to be present in the sample under investigation. Depending on the way this technique for obtaining the spectrum is applied, one can analyze the local environment of atoms located either within the sample volume or at its surface. We investigate the physical phenomena on which the method is based, the mathematical techniques used to process the experimental data, and various methods of recording the spectra. We present a series of examples in which EXAFS spectroscopy is used to study superionic conductors, compounds with intermediate valence, biological molecules, solid solutions, catalysts, surface layers and intercalated compounds.
English version:
Physics–Uspekhi, 1986, Volume 29, Issue 6, Pages 539–569
DOI: https://doi.org/10.1070/PU1986v029n06ABEH003418
Document Type: Article
UDC: 543.422.8
PACS: 78.70.Dm, 61.10.Ht
Language: Russian
Citation: I. B. Borovskii, R. V. Vedrinskii, V. L. Kraǐzman, V. P. Sachenko, “EXAFS spectroscopy: a new method for structural investigation”, UFN, 149:2 (1986), 275–324; Phys. Usp., 29:6 (1986), 539–569
Citation in format AMSBIB
\Bibitem{BorVedKra86}
\by I.~B.~Borovskii, R.~V.~Vedrinskii, V.~L.~Kra{\v\i}zman, V.~P.~Sachenko
\paper EXAFS spectroscopy: a new method for structural investigation
\jour UFN
\yr 1986
\vol 149
\issue 2
\pages 275--324
\mathnet{http://mi.mathnet.ru/ufn8121}
\crossref{https://doi.org/10.3367/UFNr.0149.198606d.0275}
\transl
\jour Phys. Usp.
\yr 1986
\vol 29
\issue 6
\pages 539--569
\crossref{https://doi.org/10.1070/PU1986v029n06ABEH003418}
Linking options:
  • https://www.mathnet.ru/eng/ufn8121
  • https://www.mathnet.ru/eng/ufn/v149/i2/p275
  • This publication is cited in the following 38 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Успехи физических наук Physics-Uspekhi
    Statistics & downloads:
    Abstract page:67
    Full-text PDF :45
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024