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Uspekhi Fizicheskikh Nauk, 1987, Volume 152, Number 2, Pages 357–358
DOI: https://doi.org/10.3367/UFNr.0152.198706q.0357 (Mi ufn7971) 		 
This article is cited in 1 scientific paper (total in 1 paper)

BIBLIOGRAPHY

Scanning electron microscopy

V. G. Dyukov
Full-text PDF (45 kB) Citations (1)
DOI: https://doi.org/10.3367/UFNr.0152.198706q.0357
Abstract: L. Reimer. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer-Verlag, Berlin; Heidelberg; New York; Tokyo, 1985, pp. 457 (Springer Series in Optical Sciences. V. 45).
English version:
Physics–Uspekhi, 1987, Volume 30, Issue 6, Pages 552
DOI: https://doi.org/10.1070/PU1987v030n06ABEH002866
Document Type: Critic, bibliography
UDC: 337.533.35(049.3)
PACS: 68.37.Hk
Language: Russian
Citation: V. G. Dyukov, “Scanning electron microscopy”, UFN, 152:2 (1987), 357–358; Phys. Usp., 30:6 (1987), 552
Citation in format AMSBIB
\Bibitem{Dyu87}
\by V.~G.~Dyukov
\paper Scanning electron microscopy
\jour UFN
\yr 1987
\vol 152
\issue 2
\pages 357--358
\mathnet{http://mi.mathnet.ru/ufn7971}
\crossref{https://doi.org/10.3367/UFNr.0152.198706q.0357}
\transl
\jour Phys. Usp.
\yr 1987
\vol 30
\issue 6
\pages 552
\crossref{https://doi.org/10.1070/PU1987v030n06ABEH002866}
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    • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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