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Uspekhi Fizicheskikh Nauk, 1987, Volume 152, Number 1, Pages 75–122
DOI: https://doi.org/10.3367/UFNr.0152.198705c.0075
(Mi ufn7940)
 

This article is cited in 14 scientific papers (total in 14 papers)

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Electron microscopy at atomic resolution

B. K. Vaĭnshteĭn

Institute of Cristallography of the USSR Academy of Sciences, Moscow
Abstract: Contemporary transmission electron microscopes have resolutions down to 1.5–2 $\mathring{\mathrm{A}}$, and this enables one to observe atoms directly. A theory is presented of the formation of electronmicroscope images at atomic resolution, the influence of aberrations, the properties of the transfer function, and the methods of processing, calculating, and interpreting images. The relation is examined between electron microscopy and electron diffraction. Examples are given of electron-microscope studies of the atomic structure of various objects–molecules, crystals, various organic and inorganic compounds, including minerals and semiconductors, and of studies of defects of crystal-structure and of its formation during crystal growth.
English version:
Physics–Uspekhi, 1987, Volume 30, Issue 5, Pages 393–419
DOI: https://doi.org/10.1070/PU1987v030n05ABEH002898
Document Type: Article
UDC: 537.533.35
PACS: 07.78.+s, 68.37.Lp, 61.66.-f
Language: Russian
Citation: B. K. Vaǐnshteǐn, “Electron microscopy at atomic resolution”, UFN, 152:1 (1987), 75–122; Phys. Usp., 30:5 (1987), 393–419
Citation in format AMSBIB
\Bibitem{Van87}
\by B.~K.~Va{\v\i}nshte{\v\i}n
\paper Electron microscopy at atomic resolution
\jour UFN
\yr 1987
\vol 152
\issue 1
\pages 75--122
\mathnet{http://mi.mathnet.ru/ufn7940}
\crossref{https://doi.org/10.3367/UFNr.0152.198705c.0075}
\transl
\jour Phys. Usp.
\yr 1987
\vol 30
\issue 5
\pages 393--419
\crossref{https://doi.org/10.1070/PU1987v030n05ABEH002898}
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  • This publication is cited in the following 14 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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