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This article is cited in 60 scientific papers (total in 60 papers)
NEW INSTRUMENTS AND RESEARCH METHODS
Polarization phenomena in x-ray optics
V. A. Belyakov, V. E. Dmitrienko Scientific and Research Centre on Surface and Vacuum Properties Investigations, Moscow
Abstract:
This review is devoted to polarization phenomena observed in the x-ray range. It is noted that x-ray polarization effects are due to two physical factors, namely, the diffraction of x-rays and the anisotropy of the x-ray susceptibility of atoms in crystals. Diffraction-induced birefringence, dichroism, and change in polarization state are very dependent on the degree of imperfection of the crystal. Effects associated with the anisotropy of x-ray susceptibility, which have not been adequately investigated so far, are discussed in some detail. The anisotropy can lead to a qualitatively new effect, namely, the appearance of additional reflections with unusual polarization properties that provide information about crystal structure and chemical bonding. Magnetic scattering of synchrotron x-rays has become a powerful tool for the investigation of magnetic ordering in crystals. Practical applications discussed in this review include different modern x-ray polarizers, analyzers, and quarter-wave plates for obtaining and analyzing circular polarizations.
Citation:
V. A. Belyakov, V. E. Dmitrienko, “Polarization phenomena in x-ray optics”, UFN, 158:4 (1989), 679–721; Phys. Usp., 32:8 (1989), 697–719
Linking options:
https://www.mathnet.ru/eng/ufn7686 https://www.mathnet.ru/eng/ufn/v158/i4/p679
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Abstract page: | 52 | Full-text PDF : | 23 |
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