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This article is cited in 9 scientific papers (total in 10 papers)
REVIEWS OF TOPICAL PROBLEMS
Metalenses for subwavelength imaging
K. V. Baryshnikovaa, S. S. Kharintsevb, P. A. Belova, N. A. Ustimenkoa, S. A. Tretyakovc, C. R. Simovskic a ITMO University, St. Petersburg
b Institute of Physics, Kazan Federal University
c Aalto University, School of Electrical Engineering
Abstract:
Devices that form an optical image with a subwavelength resolution in real time—metalenses—are considered. Such devices either operate with near optical fields or convert near fields into wave fields. As a result, the spatial resolution of these devices is not limited by the diffraction limit. At the same time, the image is formed at a considerable distance from the object, which distinguishes near-field metalenses from the instruments used in near-field probe microscopy. Metalenses are implemented based on metamaterials or their two-dimensional analogs, metasurfaces. Historically, this line of research was based on the so-called perfect lens, the concept of which did not withstand experimental verification but gave impetus to the development of real metalenses. Depending on the device and principle of operation, metalenses are called either superlenses or hyperlenses.
Received: August 26, 2020 Revised: March 12, 2021 Accepted: March 19, 2021
Citation:
K. V. Baryshnikova, S. S. Kharintsev, P. A. Belov, N. A. Ustimenko, S. A. Tretyakov, C. R. Simovski, “Metalenses for subwavelength imaging”, UFN, 192:4 (2022), 386–412; Phys. Usp., 65:4 (2022), 355–378
Linking options:
https://www.mathnet.ru/eng/ufn6916 https://www.mathnet.ru/eng/ufn/v192/i4/p386
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