Time-resolved X-ray reciprocal space mapping of a crystal in an external electric field

A reciprocal space mapping technique with the use of triple-crystal time-resolved X-ray diffractometry has been developed and implemented using a laboratory X-ray source for the first time. This technique allows studying fast processes that occur in a sample under external influences that cause reversible deformations of its crystal lattice. It also allows distinguishing these processes in time and distinguishing different types of crystal deformations caused by these actions. The essence of the technique is to measure time dependences of the intensity for each point of the reciprocal space in the vicinity of the diffraction maximum in three-axis diffraction geometry by subjecting the sample to repeated and structurally identical action of a strong electric field, with the subsequent construction of the time evolution of the two-dimensional reciprocal space map. The time resolution is achieved with the use of a high-speed multichannel intensity analyzer synchronized with a high-voltage source. The results of measuring the reciprocal space maps with a laboratory radiation source with a time resolution of up to 10 ms are demonstrated for a piezoelectric crystal of lanthanum gallium silicate subjected to an external electric field with the field strength 3.08 kV mm$^{-1}$, which is close to the sample breakdown value.