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Uspekhi Fizicheskikh Nauk, 2023, Volume 193, Number 10, Pages 1047–1070
DOI: https://doi.org/10.3367/UFNr.2022.12.039283 (Mi ufn15521) 		 
INSTRUMENTS AND METHODS OF INVESTIGATION

Talbot and Talbot–Lau X-ray interferometers

V. V. Lider

Federal Scientific Research Center `Crystallography and Photonics', Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Moscow
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DOI: https://doi.org/10.3367/UFNr.2022.12.039283
Abstract: The operating principles and capabilities of X-ray grating interferometry are described using Talbot and Talbot–Lau interferometers as examples. Various types of diffraction gratings and methods for their production are described. Methods for collecting data in radiography and computed tomography, the origin of artifacts in X-ray images, and methods of suppressing them are considered. Particular attention is devoted to dark-field X-ray imaging and its application in medicine.
Funding agency Grant number
Ministry of Science and Higher Education of the Russian Federation
The study was carried out within the State Assignment for the Federal Scientific Research Center, Crystallography and Photonics, Russian Academy of Sciences.
Received: July 19, 2022
Revised: November 9, 2022
Accepted: November 11, 2022
English version:
Physics–Uspekhi, 2023, Volume 66, Issue 10, Pages 987–1007
DOI: https://doi.org/10.3367/UFNe.2022.12.039283
Bibliographic databases:
Document Type: Article
PACS: 07.85.-m, 41.50.+h, 42.79.Dj, 87.59.-e
Language: Russian
Citation: V. V. Lider, “Talbot and Talbot–Lau X-ray interferometers”, UFN, 193:10 (2023), 1047–1070; Phys. Usp., 66:10 (2023), 987–1007
Citation in format AMSBIB
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