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Uspekhi Fizicheskikh Nauk, 1965, Volume 86, Number 1, Pages 175–179
DOI: https://doi.org/10.3367/UFNr.0086.196505f.0175 (Mi ufn11816) 		 
This article is cited in 16 scientific papers (total in 16 papers)

FROM THE CURRENT LITERATURE

Thin-film electron interferometers

L. V. Iogansen
Full-text PDF (410 kB) Citations (16)
DOI: https://doi.org/10.3367/UFNr.0086.196505f.0175
English version:
Physics–Uspekhi, 1965, Volume 8, Issue 3, Pages 413–416
DOI: https://doi.org/10.1070/PU1965v008n03ABEH003052
Document Type: Article
UDC: 539.124
PACS: 85.30.Mn, 73.50.-h, 73.40.Gk, 84.47.+w
Language: Russian
Citation: L. V. Iogansen, “Thin-film electron interferometers”, UFN, 86:1 (1965), 175–179; Phys. Usp., 8:3 (1965), 413–416
Citation in format AMSBIB
\Bibitem{Iog65}
\by L.~V.~Iogansen
\paper Thin-film electron interferometers
\jour UFN
\yr 1965
\vol 86
\issue 1
\pages 175--179
\mathnet{http://mi.mathnet.ru/ufn11816}
\crossref{https://doi.org/10.3367/UFNr.0086.196505f.0175}
\transl
\jour Phys. Usp.
\yr 1965
\vol 8
\issue 3
\pages 413--416
\crossref{https://doi.org/10.1070/PU1965v008n03ABEH003052}
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  • https://www.mathnet.ru/eng/ufn/v86/i1/p175
    • This publication is cited in the following 16 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Успехи физических наук Physics-Uspekhi
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