|
This article is cited in 32 scientific papers (total in 32 papers)
NEW INSTRUMENTS AND METHODS OF MEASUREMENT
Methods of measuring small phase difference changes in interference devices
A. I. Kartashov, I. Sh. Etsin D. I. Mendeleev Institute for Metrology, Leningrad
Abstract:
A review is presented of the present status of the technology of interference measurements of small changes of certain physical quantities. The capability limits of measurements with the aid of interference, imposed by diffraction and by noise in the radiation source and receiver, are analyzed. The most effective visual and photometric methods of measuring phase differences of interfering beams are described. The modulation method, in which a phase difference change of (10$^{-5}$–10$^{-6}$)·2$\pi$ can be detected, and the phase method used in automatic interferometers are considered in greater detail.
Citation:
A. I. Kartashov, I. Sh. Etsin, “Methods of measuring small phase difference changes in interference devices”, UFN, 106:4 (1972), 687–721; Phys. Usp., 15:2 (1972), 232–250
Linking options:
https://www.mathnet.ru/eng/ufn10565 https://www.mathnet.ru/eng/ufn/v106/i4/p687
|
Statistics & downloads: |
Abstract page: | 39 | Full-text PDF : | 17 |
|