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Uspekhi Fizicheskikh Nauk, 1972, Volume 106, Number 4, Pages 687–721
DOI: https://doi.org/10.3367/UFNr.0106.197204h.0687
(Mi ufn10565)
 

This article is cited in 32 scientific papers (total in 32 papers)

NEW INSTRUMENTS AND METHODS OF MEASUREMENT

Methods of measuring small phase difference changes in interference devices

A. I. Kartashov, I. Sh. Etsin

D. I. Mendeleev Institute for Metrology, Leningrad
Abstract: A review is presented of the present status of the technology of interference measurements of small changes of certain physical quantities. The capability limits of measurements with the aid of interference, imposed by diffraction and by noise in the radiation source and receiver, are analyzed. The most effective visual and photometric methods of measuring phase differences of interfering beams are described. The modulation method, in which a phase difference change of (10$^{-5}$–10$^{-6}$)·2$\pi$ can be detected, and the phase method used in automatic interferometers are considered in greater detail.
English version:
Physics–Uspekhi, 1972, Volume 15, Issue 2, Pages 232–250
DOI: https://doi.org/10.1070/PU1972v015n02ABEH004966
Document Type: Article
UDC: 534.854
PACS: 07.60.Ly, 06.30.Bp, 85.60.-q
Language: Russian
Citation: A. I. Kartashov, I. Sh. Etsin, “Methods of measuring small phase difference changes in interference devices”, UFN, 106:4 (1972), 687–721; Phys. Usp., 15:2 (1972), 232–250
Citation in format AMSBIB
\Bibitem{KarEts72}
\by A.~I.~Kartashov, I.~Sh.~Etsin
\paper Methods of measuring small phase difference changes in interference devices
\jour UFN
\yr 1972
\vol 106
\issue 4
\pages 687--721
\mathnet{http://mi.mathnet.ru/ufn10565}
\crossref{https://doi.org/10.3367/UFNr.0106.197204h.0687}
\transl
\jour Phys. Usp.
\yr 1972
\vol 15
\issue 2
\pages 232--250
\crossref{https://doi.org/10.1070/PU1972v015n02ABEH004966}
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  • This publication is cited in the following 32 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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