Approach to test method selection for mixed-signal integrated circuits based on cost model

The model has been proposed of test cost estimation for mixed-signal integrated circuits (IC) taking into account features of integrated technology used and of fab production line. The approach of test technique selection to minimize test cost is suggested for mixed-signal IC. Decision rules are defined for both on-chip and off-chip test selection, which can be developed on the base of the proposed model already at early stages of IC design. Experimental results have been shown.