Teplofizika vysokikh temperatur
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Forthcoming papers
Archive
Impact factor
Guidelines for authors
Submit a manuscript

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


TVT:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Teplofizika vysokikh temperatur, 1971, Volume 9, Issue 2, Pages 448–450 (Mi tvt7990)  
Short Communications

Measurement of the Thermoelectric Sensitivity of Thin Films

V. M. Abrosimov, B. N. Egorov

Moscow Institute of Physics and Technology
Full-text PDF (2700 kB)
Received: 20.07.1970
Document Type: Article
UDC: 539.23:537.323
Language: Russian
Citation: V. M. Abrosimov, B. N. Egorov, “Measurement of the Thermoelectric Sensitivity of Thin Films”, TVT, 9:2 (1971), 448–450; High Temperature, 9:2 (1971), 411–412
Citation in format AMSBIB
\Bibitem{AbrEgo71}
\by V.~M.~Abrosimov, B.~N.~Egorov
\paper Measurement of the Thermoelectric Sensitivity of Thin Films
\jour TVT
\yr 1971
\vol 9
\issue 2
\pages 448--450
\mathnet{http://mi.mathnet.ru/tvt7990}
\transl
\jour High Temperature
\yr 1971
\vol 9
\issue 2
\pages 411--412
Linking options:
  • https://www.mathnet.ru/eng/tvt7990
  • https://www.mathnet.ru/eng/tvt/v9/i2/p448
    • Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Teplofizika vysokikh temperatur Teplofizika vysokikh temperatur
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024