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Teplofizika vysokikh temperatur, 1971, Volume 9, Issue 2, Pages 448–450 (Mi tvt7990)  
Short Communications

Measurement of the Thermoelectric Sensitivity of Thin Films

V. M. Abrosimov, B. N. Egorov

Moscow Institute of Physics and Technology
Full-text PDF (2700 kB)
Received: 20.07.1970
Document Type: Article
UDC: 539.23:537.323
Language: Russian
Citation: V. M. Abrosimov, B. N. Egorov, “Measurement of the Thermoelectric Sensitivity of Thin Films”, TVT, 9:2 (1971), 448–450; High Temperature, 9:2 (1971), 411–412
Citation in format AMSBIB
\Bibitem{AbrEgo71}
\by V.~M.~Abrosimov, B.~N.~Egorov
\paper Measurement of the Thermoelectric Sensitivity of Thin Films
\jour TVT
\yr 1971
\vol 9
\issue 2
\pages 448--450
\mathnet{http://mi.mathnet.ru/tvt7990}
\transl
\jour High Temperature
\yr 1971
\vol 9
\issue 2
\pages 411--412
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  • https://www.mathnet.ru/eng/tvt/v9/i2/p448
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