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Teplofizika vysokikh temperatur, 1977, Volume 15, Issue 5, Pages 994–999
(Mi tvt7222)
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Thermophysical Properties of Materials
Method of measuring the thermal conductivity of thin films normal to the layer
B. N. Egorov, V. S. Kilesso, A. G. Komarov Moscow
Abstract:
A method of measuring the thermal conductivity of thin films is proposed, in which a fundamentally new procedure for measuring the temperature drop on a thin layer is used. An analysis of the systematic error is given. The minimum film thickness for which this method may be used to measure the thermal conductivity is determined.
Received: 11.08.1976
Citation:
B. N. Egorov, V. S. Kilesso, A. G. Komarov, “Method of measuring the thermal conductivity of thin films normal to the layer”, TVT, 15:5 (1977), 994–999; High Temperature, 15:5 (1977), 841–845
Linking options:
https://www.mathnet.ru/eng/tvt7222 https://www.mathnet.ru/eng/tvt/v15/i5/p994
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Statistics & downloads: |
Abstract page: | 228 | Full-text PDF : | 133 |
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