Teplofizika vysokikh temperatur
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Teplofizika vysokikh temperatur, 1977, Volume 15, Issue 5, Pages 994–999 (Mi tvt7222)  
Thermophysical Properties of Materials

Method of measuring the thermal conductivity of thin films normal to the layer

B. N. Egorov, V. S. Kilesso, A. G. Komarov

Moscow
Full-text PDF (352 kB)
Abstract: A method of measuring the thermal conductivity of thin films is proposed, in which a fundamentally new procedure for measuring the temperature drop on a thin layer is used. An analysis of the systematic error is given. The minimum film thickness for which this method may be used to measure the thermal conductivity is determined.
Received: 11.08.1976
Bibliographic databases:
Document Type: Article
UDC: 536.2
Language: Russian
Citation: B. N. Egorov, V. S. Kilesso, A. G. Komarov, “Method of measuring the thermal conductivity of thin films normal to the layer”, TVT, 15:5 (1977), 994–999; High Temperature, 15:5 (1977), 841–845
Citation in format AMSBIB
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\by B.~N.~Egorov, V.~S.~Kilesso, A.~G.~Komarov
\paper Method of measuring the thermal conductivity of thin films normal to the layer
\jour TVT
\yr 1977
\vol 15
\issue 5
\pages 994--999
\mathnet{http://mi.mathnet.ru/tvt7222}
\transl
\jour High Temperature
\yr 1977
\vol 15
\issue 5
\pages 841--845
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\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-0017534738}
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