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Teplofizika vysokikh temperatur, 1985, Volume 23, Issue 3, Pages 577–585 (Mi tvt5354)  

High Temperature Apparatuses and Structures

Copper electrode damage mechanisms in a MHDG channel

I. I. Beilis

Institute for High Temperatures, USSR Academy of Sciences, Moscow
Received: 29.04.1984
Bibliographic databases:
Document Type: Article
UDC: 621.313.12:538.4
Language: Russian
Citation: I. I. Beilis, “Copper electrode damage mechanisms in a MHDG channel”, TVT, 23:3 (1985), 577–585; High Temperature, 23:3 (1985), 471–478
Citation in format AMSBIB
\Bibitem{Bei85}
\by I.~I.~Beilis
\paper Copper electrode damage mechanisms in a MHDG channel
\jour TVT
\yr 1985
\vol 23
\issue 3
\pages 577--585
\mathnet{http://mi.mathnet.ru/tvt5354}
\transl
\jour High Temperature
\yr 1985
\vol 23
\issue 3
\pages 471--478
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1985AXK9300025}
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  • https://www.mathnet.ru/eng/tvt5354
  • https://www.mathnet.ru/eng/tvt/v23/i3/p577
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