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Teplofizika vysokikh temperatur, 1996, Volume 34, Issue 5, Pages 823–825 (Mi tvt2816)  
Short Communications

The use of thermal imaging to study the kinetics of thermolysis and evaporation of thin layers of matter

D. A. Rogatkin, O. F. Shlenskii, D. N. Yundev

Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow
Full-text PDF (1026 kB) Citations (1)
Received: 19.12.1995
Bibliographic databases:
Document Type: Article
UDC: 66.092:536.42
Language: Russian
Citation: D. A. Rogatkin, O. F. Shlenskii, D. N. Yundev, “The use of thermal imaging to study the kinetics of thermolysis and evaporation of thin layers of matter”, TVT, 34:5 (1996), 823–825; High Temperature, 34:5 (1996), 815–816
Citation in format AMSBIB
\Bibitem{RogShlYun96}
\by D.~A.~Rogatkin, O.~F.~Shlenskii, D.~N.~Yundev
\paper The use of thermal imaging to study the kinetics of thermolysis and evaporation of thin layers of matter
\jour TVT
\yr 1996
\vol 34
\issue 5
\pages 823--825
\mathnet{http://mi.mathnet.ru/tvt2816}
\transl
\jour High Temperature
\yr 1996
\vol 34
\issue 5
\pages 815--816
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=A1996VL50500025}
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  • https://www.mathnet.ru/eng/tvt/v34/i5/p823
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