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Teplofizika vysokikh temperatur, 1971, Volume 9, Issue 3, Pages 652–654 (Mi tvt10428)  
Short Communications

Electron-diffraction determination of the integrated emissivity of thin films

B. T. Boyko, V. M. Bratsikhin, A. T. Pugachev

Khar'kov Polytechnical Institute
Full-text PDF (279 kB)
Received: 18.07.1970
Document Type: Article
UDC: 535.231.6
Language: Russian
Citation: B. T. Boyko, V. M. Bratsikhin, A. T. Pugachev, “Electron-diffraction determination of the integrated emissivity of thin films”, TVT, 9:3 (1971), 652–654; High Temperature, 9:3 (1971), 600–602
Citation in format AMSBIB
\Bibitem{BoyBraPug71}
\by B.~T.~Boyko, V.~M.~Bratsikhin, A.~T.~Pugachev
\paper Electron-diffraction determination of the integrated emissivity of thin films
\jour TVT
\yr 1971
\vol 9
\issue 3
\pages 652--654
\mathnet{http://mi.mathnet.ru/tvt10428}
\transl
\jour High Temperature
\yr 1971
\vol 9
\issue 3
\pages 600--602
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  • https://www.mathnet.ru/eng/tvt/v9/i3/p652
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