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This article is cited in 1 scientific paper (total in 1 paper)
Self-timed pipeline immunity to soft errors in its combinational part
Yu. A. Stepchenkov, Yu. G. Diachenko, Yu. V. Rogdestvenski, N. V. Morozov, D. Yu. Stepchenkov, D. Yu. Diachenko Federal Research Center "Computer Science and Control" of the Russian Academy of Sciences, 44-2 Vavilov Str., Moscow 119333, Russian Federation
Abstract:
The paper estimates the data corruption probability in self-timed circuits manufactured by a standard 65-nanometer and below CMOS process because of short-term soft errors that occurred in the pipeline combinational part. Soft errors appear as a result of the external causes and internal noise sources. The paper analyzes events able to lead to data corruption in the pipeline due to soft errors. In the worth case, self-timed pipeline is naturally immune to 84.4% soft errors in its combinational part due to self-timed circuit features. Proposed layout synthesis techniques increase soft error tolerance of the pipeline up to 85.6%. Indication of the state of the paraphase signal, inversed to its spacer, as spacer provides self-timed pipeline immunity to 98.6% of single soft errors at the expanse of pipeline hardware complexity by less than 1%.
Keywords:
self-timed circuit, soft error tolerance, pipeline.
Received: 25.03.2020
Citation:
Yu. A. Stepchenkov, Yu. G. Diachenko, Yu. V. Rogdestvenski, N. V. Morozov, D. Yu. Stepchenkov, D. Yu. Diachenko, “Self-timed pipeline immunity to soft errors in its combinational part”, Sistemy i Sredstva Inform., 30:3 (2020), 49–55
Linking options:
https://www.mathnet.ru/eng/ssi718 https://www.mathnet.ru/eng/ssi/v30/i3/p49
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Abstract page: | 88 | Full-text PDF : | 33 | References: | 18 |
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